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Proceedings Paper

The importance of statistics for photoluminescence quantum yield measurements (Conference Presentation)
Author(s): Felix Fries; Heidi Thomas; Max Gmelch; Tim Achenbach; Sebastian Reineke

Paper Abstract

Measuring the photoluminescence quantum yield (PLQY) is a method often used within numerous fields of luminescent material science. Determining its absolute value relies on counting photons and hence, it is a very sensitive technique. Therefore, systematic errors that may occur during the measurement are discussed widely. However, the statistical uncertainty within those measurements remains mainly unconsidered. Here, we propose a new way of data analyses that exploits multiple measurements and a subsequent evaluation using the weighted mean. This leads in an efficient way to a very low statistical uncertainty. Additionally, time-dependent influences on the measurement can be identified that way.

Paper Details

Date Published: 10 March 2020
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Proc. SPIE 11277, Organic Photonic Materials and Devices XXII, 1127708 (10 March 2020); doi: 10.1117/12.2540033
Show Author Affiliations
Felix Fries, TU Dresden (Germany)
Heidi Thomas, TU Dresden (Germany)
Max Gmelch, TU Dresden (Germany)
Tim Achenbach, TU Dresden (Germany)
Sebastian Reineke, TU Dresden (Germany)


Published in SPIE Proceedings Vol. 11277:
Organic Photonic Materials and Devices XXII
Christopher E. Tabor; François Kajzar; Toshikuni Kaino, Editor(s)

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