Share Email Print
cover

Proceedings Paper

Assessment of high-purity quartz glass by laser induced fluorescence technique
Author(s): Yinchao Zhang; Ting Li; He Chen; Siying Chen; Pan Guo; Xunbao Rui; Baowei Li
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

In this paper, the laser-induced fluorescence (LIF) technology is utilized for rapid assessment of the purity of quartz glass, especially for the screening of high-purity quartz glass. A 355 nm laser was applied as excitation source to induce the fluorescence signal of the quartz glass samples. The fluorescence signal is then transmitted to the spectrometer through an optical fiber for spectral acquisition. Because only the impurities in quartz glass induce fluorescence, purity quartz glasses does not have a distinct fluorescence signals or fluorescence peaks. The purity evaluation of high-purity quartz glass can be achieved by analyzing the obtained signals. The standard deviation and the ratio of the maximum to minimum values of the signals were calculated to indicate the intensity of the fluorescent peak of the signal. The thresholds were then set to distinguish between high-purity and low-purity quartz glasses. The method has the advantages of high speed, high precision and high reliability, and is of great significance for the rapid screening of quartz glass with high purity requirements.

Paper Details

Date Published: 8 July 2019
PDF: 6 pages
Proc. SPIE 11063, Pacific Rim Laser Damage 2019: Optical Materials for High-Power Lasers, 110630N (8 July 2019); doi: 10.1117/12.2539916
Show Author Affiliations
Yinchao Zhang, Beijing Institute of Technology (China)
Ting Li, Beijing Institute of Technology (China)
He Chen, Beijing Institute of Technology (China)
Siying Chen, Beijing Institute of Technology (China)
Pan Guo, Beijing Institute of Technology (China)
Xunbao Rui, Beijing Institute of Technology (China)
Baowei Li, Beijing Institute of Technology (China)


Published in SPIE Proceedings Vol. 11063:
Pacific Rim Laser Damage 2019: Optical Materials for High-Power Lasers
Jianda Shao; Takahisa Jitsuno; Wolfgang Rudolph, Editor(s)

© SPIE. Terms of Use
Back to Top
PREMIUM CONTENT
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?
close_icon_gray