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Proceedings Paper

Machine vision inspection of fluorescent lamps
Author(s): Narinder Bains; Frank David
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Paper Abstract

This paper describes a fluorescent lamp inspection system designed for a major North American manufacturer. Operating 24 hours a day it inspects up to 16 lamp bases per hour for nine common manufacturing defects using parallel processing hardware and morphology algorithms. Hardware and software techniques used to build a robust and reliable system relatively insensitive to variations in lighting conditions and lamp appearance are described.

Paper Details

Date Published: 1 March 1991
PDF: 11 pages
Proc. SPIE 1386, Machine Vision Systems Integration in Industry, (1 March 1991); doi: 10.1117/12.25398
Show Author Affiliations
Narinder Bains, Atomic Energy of Canada Ltd. (Canada)
Frank David, Atomic Energy of Canada Ltd. (Canada)

Published in SPIE Proceedings Vol. 1386:
Machine Vision Systems Integration in Industry
Bruce G. Batchelor; Frederick M. Waltz, Editor(s)

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