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Characterizing targets’ scattering property through multi-angle imaging of active MMW system
Author(s): Ziye Wang; Yang Yu; Lingbo Qiao; Yingxin Wang; Ziran Zhao
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Paper Abstract

Current active millimeter-wave (MMW) imaging system applied to personnel surveillance uses shape recognition in the reconstructed image to identify dangerous goods. This method relies on a single kind of information namely pixel value to distinguish potential threats. It can be susceptible to interference such as noise and multiple scattering and it is difficult to distinguish fine structures. In view of this situation, this paper presents a feature acquiring through multi-angle imaging to characterize target’s scattering property. This feature can add one more dimensional information of targets except for the original reconstructed image, and it can distinguish objects more accurately to assist the realization of target classification. Electromagnetic simulation has been conducted and the reconstructed image results as well as quantitative studies show the effectiveness of this feature in assisting target distinction.

Paper Details

Date Published: 18 December 2019
PDF: 6 pages
Proc. SPIE 11334, AOPC 2019: Optoelectronic Devices and Integration; and Terahertz Technology and Applications, 113341F (18 December 2019); doi: 10.1117/12.2539619
Show Author Affiliations
Ziye Wang, Tsinghua Univ. (China)
Key Lab. of Particle & Radiation Imaging (China)
Yang Yu, Tsinghua Univ. (China)
Key Lab. of Particle & Radiation Imaging (China)
Lingbo Qiao, National Engineering Lab. for Dangerous Articles and Explosives Detecxtion Technologies (China)
Yingxin Wang, Tsinghua Univ. (China)
Key Lab. of Particle & Radiation Imaging (China)
Ziran Zhao, Tsinghua Univ. (China)
Key Lab. of Particle & Radiation Imaging (China)


Published in SPIE Proceedings Vol. 11334:
AOPC 2019: Optoelectronic Devices and Integration; and Terahertz Technology and Applications
Zhiping Zhou; Xiao-Cong Yuan; Daoxin Dai, Editor(s)

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