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The influence of CCD undersampling on the encircled energy of SVOM-VT
Author(s): Xun Xue; Chunmin Zhang; Jianke Zhao; Yan Zhou; Shangkuo Liu; Kewei E.; Kun Li; Zhengfeng Wang; Jing Li
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Paper Abstract

SVOM-VT has entered the initial phase development stage, and encircled energy is its key performance index. In the development process, it is necessary to determine the encircled energy of the optical lens stage and the system stage. The image recording of a CCD detector includes two imaging processes: one is the pixel integration imaging process, in which the output signal of each pixel is proportional to the area integration of the incident light intensity on the surface of the pixel; the other is the discrete sampling process, in which the continuous graphical object is sampled discretely at the sampling interval of the center distance of the pixel. Based on the data of SVOM-VT, the effect of CCD under-sampling on the encircled energy of detection camera is characterized by simulation and test. Imaging process of CCD pairs of scattered speckles from the lens is a two-dimensional discrete sampling process, as well as the sampling process of discrete signals. This process will lead to low-frequency noise (under-sampling noise) in the sampling of high-frequency signals by CCD detectors, resulting in spectrum aliasing (low-frequency signal distortion) of image signals. Intuitively, the original image is broadened. When the sampling density is increased, this will not be the case.

Paper Details

Date Published: 18 December 2019
PDF: 13 pages
Proc. SPIE 11341, AOPC 2019: Space Optics, Telescopes, and Instrumentation, 1134104 (18 December 2019); doi: 10.1117/12.2539072
Show Author Affiliations
Xun Xue, Xi'an Jiaotong Univ. (China)
Xi'an Institute of Optics and Precision Mechanics (China)
Chunmin Zhang, Xi'an Jiaotong Univ. (China)
Jianke Zhao, Xi'an Institute of Optics and Precision Mechanics (China)
Yan Zhou, Xi'an Institute of Optics and Precision Mechanics (China)
Shangkuo Liu, Xi'an Institute of Optics and Precision Mechanics (China)
Kewei E., Xi'an Institute of Optics and Precision Mechanics (China)
Kun Li, Xi'an Institute of Optics and Precision Mechanics (China)
Zhengfeng Wang, Xi'an Institute of Optics and Precision Mechanics (China)
Jing Li, Xi'an Institute of Optics and Precision Mechanics (China)


Published in SPIE Proceedings Vol. 11341:
AOPC 2019: Space Optics, Telescopes, and Instrumentation
Suijian Xue; Xuejun Zhang; Carl Anthony Nardell; Ziyang Zhang, Editor(s)

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