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Proceedings Paper

Lucky imaging system on FPGA by using ethernet transmission
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Paper Abstract

Lucky imaging technology is a post-processing technique for eliminating the influence of atmospheric turbulence in astronomical images to obtain high-resolution images. Reconstruction usually realized by using a desktop computer system. However, this post-processing method based on CPU can’t meet the real-time requirements of some astronomical observers. Based on a prototype of a FPGA-based lucky imaging system developed with our laboratory, a technical solution of lucky imaging technology based on Gigabit Ethernet is presented in this paper. The original short exposure images can input into the FPGA-based lucky imaging system via a Gigabit Ethernet interface. Some functional modules related to data transmission through Gigabit Ethernet are designed, and the lucky imaging processing and VGA display modules in the prototype system are transplanted. After all these works, a new lucky imaging processing system which is based on Gigabit Ethernet, has been built. This paper will firstly introduce the design methods and the implementation techniques of the Ethernet receiving module, FIFO module, DDR3 module, and the transplantation methods for the s election module, registration module, superposition module, and display module. The observed short exposure images are sent to the FPGA system by an image workstation via Gigabit Ethernet. The software in the workstation is developed in C#. The programming method is also introduced in this paper. Experiments show that compared with the old prototype system, the total time for processing 1,000 short exposure images is reduced from 42 seconds to about 10 seconds, and the real-time performance of the new system is improved.

Paper Details

Date Published: 18 November 2019
PDF: 6 pages
Proc. SPIE 11189, Optical Metrology and Inspection for Industrial Applications VI, 111891Y (18 November 2019); doi: 10.1117/12.2538855
Show Author Affiliations
Chenhao Duan, Kunming Univ. of Science and Technology (China)
Binhua Li, Kunming Univ. of Science and Technology (China)
Zhen Chen, Kunming Univ. of Science and Technology (China)
Chun He, Kunming Univ. of Science and Technology (China)
Jinliang Wang, Kunming Univ. of Science and Technology (China)

Published in SPIE Proceedings Vol. 11189:
Optical Metrology and Inspection for Industrial Applications VI
Sen Han; Toru Yoshizawa; Song Zhang; Benyong Chen, Editor(s)

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