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Proceedings Paper

Uncertainty evaluation of colour correction factor using Monte Carlo method in LED photometry measurement
Author(s): Weiqiang Zhao; Hui Liu; Jinyun Yan; Ying Su; Lin Jiang
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Paper Abstract

Nowadays, Light Emitting Diode (LED) and related products are popular in everyday lighting. Especially colour LEDs are widely used in colour application such as outdoor display, traffic signal light and cars. Precise photometric measurement results for those LED products are necessary due to needs of the international or domestic commercial trade. In the testing lab, people usually use photometer and related photometry equipment to measure LEDs. The photometer mimics the human eyes however it is not exactly the same. Thus, colour correction factor (CCF) is applied when the relative spectral response of the photometer S*(λ) is different from the photopic luminous efficiency function V(λ). Since the CCF is the most significant uncertainty component in LED total luminous flux and averaged LED luminous intensity measurement, the evaluation of uncertainty of CCF become more important in National Institute of Metrology China (NIM). Recently the Monte-Carlo method, as known as numerical simulation technique, is utilized to evaluate uncertainty by generating millions of random variable with related distribution function. The input mathematical model of the photometer S*(λ) and spectra of measurand PLED(λ) are described. The propagation of the uncertainty is also introduced. Examples of the evaluation of CCF uncertainty are shown.

Paper Details

Date Published: 18 November 2019
PDF: 6 pages
Proc. SPIE 11189, Optical Metrology and Inspection for Industrial Applications VI, 111891V (18 November 2019); doi: 10.1117/12.2538759
Show Author Affiliations
Weiqiang Zhao, National Institute of Metrology (China)
Hui Liu, National Institute of Metrology (China)
Jinyun Yan, National Institute of Metrology (China)
Ying Su, National Institute of Metrology (China)
Lin Jiang, National Institute of Metrology (China)


Published in SPIE Proceedings Vol. 11189:
Optical Metrology and Inspection for Industrial Applications VI
Sen Han; Toru Yoshizawa; Song Zhang; Benyong Chen, Editor(s)

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