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Proceedings Paper

Research on nondestructive measurement of spectral responsivity of photovoltaic modules
Author(s): Junchao Zhang; Yangyang Wang; Limin Xiong; Yingwei He; Haifeng Meng; Bifeng Zhang; Chuan Cai; Shuai Man
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Paper Abstract

The effects of monochromatic light modes and filtering systems on the measurement of spectral responsivity of photovoltaic(PV) modules are analyzed. According to the structure characteristics of PV modules, a PV module spectral responsivity measurement device was established based on the steady-state monochrome light source, main bias light source, auxiliary bias light source and phase-locked filter testing system. The nondestructive testing of spectral responsivity of solar cells in PV module was realized. The effects of irradiance of main bias light source, irradiance of auxiliary bias light source and temperature of PV module on spectral responsivity and spectral mismatch factor are analyzed. The influence of different sampling monochrome spot area on the relative spectral response measurement of solar cells under small spot test conditions is analyzed. The spectral responsivity of the PV module slices was tested by using the small spot measurement system. The accuracy of the nondestructive measurement device is verified by comparing the nondestructive test results with the slice measurement results.

Paper Details

Date Published: 18 November 2019
PDF: 9 pages
Proc. SPIE 11189, Optical Metrology and Inspection for Industrial Applications VI, 111891S (18 November 2019); doi: 10.1117/12.2537912
Show Author Affiliations
Junchao Zhang, National Institute of Metrology (China)
Yangyang Wang, National Institute of Metrology (China)
Limin Xiong, National Institute of Metrology (China)
Yingwei He, National Institute of Metrology (China)
Haifeng Meng, National Institute of Metrology (China)
Bifeng Zhang, National Institute of Metrology (China)
Chuan Cai, National Institute of Metrology (China)
Shuai Man, National Institute of Metrology (China)


Published in SPIE Proceedings Vol. 11189:
Optical Metrology and Inspection for Industrial Applications VI
Sen Han; Toru Yoshizawa; Song Zhang; Benyong Chen, Editor(s)

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