Share Email Print

Proceedings Paper

Realization of high-intensity focusing ultrasound pressure and detection of sound field
Author(s): Jie Zhao; Weimin Zhu; Jinyu Lu; Tao Liu; Dayong Wang
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

In the ultrasound field, the parameters of the therapeutic sound field can’t trace to the source, or be directly measured. In order to solve this problem, this paper builds a system to obtain high-intensity focusing ultrasound pressure and detect sound field. High-intensity ultrasound pressure is detected directly by laser scanning technology. This technology overcomes the disadvantages of needlelike or thin-film hydrophone, whose tolerance is low, invasive detection influences the ultrasound field, and limited size brings the amendment average effect. Firstly, the general principle to measure the ultrasound pressure is proposed. The optical interference method is adopted to put a thin film coated with gold into the ultrasound field. When the thickness of the thin film is much smaller than the wavelength of the ultrasound, the vibration velocity of the thin film can be obtained by laser vibrometer, then the sound pressure of the same position can be calculated accordingly. Secondly, the configuration of the system is clearly shown, including the hardware and software. The system can realize scanning the ultrasound field, and obtain the characteristics parameters. Finally, the achieved target is introduced. The range of frequency is from 0.5 MHz to 60 MHz with 10 MPa@1 MHz peak-to-peak sound pressure value. The scanning configuration has the spatial accuracy better than 0.02 mm, and X/Y/Z scope larger than 400 mm. The above parameters mainly meet the requirement of the therapeutic sound field.

Paper Details

Date Published: 18 November 2019
PDF: 8 pages
Proc. SPIE 11189, Optical Metrology and Inspection for Industrial Applications VI, 111891Q (18 November 2019); doi: 10.1117/12.2537803
Show Author Affiliations
Jie Zhao, Henan Institute of Metrology (China)
Beijing Univ. of Technology (China)
Weimin Zhu, Henan Institute of Metrology (China)
Jinyu Lu, Henan Institute of Metrology (China)
Tao Liu, Henan Institute of Metrology (China)
Dayong Wang, Beijing Univ. of Technology (China)

Published in SPIE Proceedings Vol. 11189:
Optical Metrology and Inspection for Industrial Applications VI
Sen Han; Toru Yoshizawa; Song Zhang; Benyong Chen, Editor(s)

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?