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A planar-pattern-based calibration method for high-precision structured laser triangulation measurement
Author(s): Ruiming Chen; Xinghui Li; Xiaohao Wang; Jianxiong Li; Gaopeng Xue; Qian Zhou; Kai Ni
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Paper Abstract

A flexible calibration method with high precision was proposed for calibration of structured laser triangulation in the applications of 3D reconstruction and point cloud processing. The camera coordinate system was chosen as the ultimate reference coordinate. In this calibration process, be required only a planar pattern placed at different orientations and positions for obtainment of the camera intrinsic parameters. And then two or more non-coplanar sets of three collinear points were calculated for the laser projection plane coefficients. A line laser triangulation measurement system is established, consisted of laser diode, cylindrical lens module and camera imaging system. Experimental results based on the constructed structured laser triangulation system revealed that accuracy of the profile measurement is less than ±0.005mm, which can meet the majority of industrial inspection applications.

Paper Details

Date Published: 18 November 2019
PDF: 7 pages
Proc. SPIE 11189, Optical Metrology and Inspection for Industrial Applications VI, 1118914 (18 November 2019); doi: 10.1117/12.2537757
Show Author Affiliations
Ruiming Chen, Tsinghua Univ. Shenzhen International Graduate School (China)
Xinghui Li, Tsinghua Univ. Shenzhen International Graduate School (China)
Xiaohao Wang, Tsinghua Univ. Shenzhen International Graduate School (China)
Jianxiong Li, Tsinghua Univ. Shenzhen International Graduate School (China)
Gaopeng Xue, Tsinghua Univ. Shenzhen International Graduate School (China)
Qian Zhou, Tsinghua Univ. Shenzhen International Graduate School (China)
Kai Ni, Tsinghua Univ. Shenzhen International Graduate School (China)


Published in SPIE Proceedings Vol. 11189:
Optical Metrology and Inspection for Industrial Applications VI
Sen Han; Toru Yoshizawa; Song Zhang; Benyong Chen, Editor(s)

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