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Measurement of rotation angle by response of nanostructured metasurfaces
Author(s): Alexander M. Boronakhin; Ekaterina A. Efremova; Egor V. Shalymov; Roman V. Shalymov; Vladimir Yu. Venediktov; Anastasia V. Venediktova
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Paper Abstract

In recent decades a noticeable surge in research on nanostructured materials and their interactions with light has been observed. This is explained not only by basic interest, but also by the potential of miniaturization of devices and the expansion of their functional capabilities through the use of metasurfaces. On the other hand, in the last decade a pronounced tendency towards miniaturization of position control and navigation systems can be observed either. A need of positioning and navigation of small-sized mobile objects arises frequently. At the same time, the size of controlled objects is constantly decreasing, and the development of sensors for micro- and nanoscale objects is already required nowadays. Therefore, the use of nanostructured metasurfaces in position control and navigation systems seems to be extremely promising. We focus on the use of nanostructured metasurfaces for rotation angle determination. We discuss a new rotation angle measurement method where metasurface amplitude response is used, its main advantages and disadvantages are demonstrated, a variant of its improvement is proposed.

Paper Details

Date Published: 20 November 2019
PDF: 7 pages
Proc. SPIE 11191, Advanced Sensor Systems and Applications IX, 111910J (20 November 2019); doi: 10.1117/12.2537754
Show Author Affiliations
Alexander M. Boronakhin, Saint Petersburg Electrotechnical Univ. "LETI" (Russian Federation)
Ekaterina A. Efremova, ITMO Univ. (Russian Federation)
Egor V. Shalymov, Saint Petersburg Electrotechnical Univ. "LETI" (Russian Federation)
Roman V. Shalymov, Saint Petersburg Electrotechnical Univ. "LETI" (Russian Federation)
Vladimir Yu. Venediktov, Saint Petersburg Electrotechnical Univ. "LETI" (Russian Federation)
Anastasia V. Venediktova, Saint Petersburg Electrotechnical Univ. "LETI" (Russian Federation)


Published in SPIE Proceedings Vol. 11191:
Advanced Sensor Systems and Applications IX
Tiegen Liu; Gang-Ding Peng; Zuyuan He, Editor(s)

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