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Proceedings Paper

Colored Ronchi pattern for fringe projection profilometry
Author(s): Jayson P. Cabanilla; Nathaniel Hermosa
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Paper Abstract

We developed a color Ronchi pattern, a new form of fringe pattern, that can effectively used in fringe projection profilometry. The pattern is formed such that color channels red, green and blue are in separate spatial domains. From a single-shot image of the structured pattern, we are able to reconstruct the surface profile of a distorted paint canvas using both Fourier transform profilometry (FTP) and phase shifting profilometry (PSP). From the three surface reconstructions obtained using FTP, tiny artifacts in the form of ripples are observed. These artifacts are significantly reduced when the surface measurements in FTP are averaged. Experimental results have shown that both FTP and PSP successfully reconstructed the profile of a distorted paint canvas with a measurement difference between 10.00% to 15.00% from the actual displacement.

Paper Details

Date Published: 18 November 2019
PDF: 8 pages
Proc. SPIE 11189, Optical Metrology and Inspection for Industrial Applications VI, 111891M (18 November 2019); doi: 10.1117/12.2537690
Show Author Affiliations
Jayson P. Cabanilla, Univ. of the Philippines Diliman (Philippines)
Nathaniel Hermosa, Univ. of the Philippines Diliman (Philippines)


Published in SPIE Proceedings Vol. 11189:
Optical Metrology and Inspection for Industrial Applications VI
Sen Han; Toru Yoshizawa; Song Zhang; Benyong Chen, Editor(s)

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