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Prediction of the angle of rotation to be caused by optical rotation phenomenon in optical active materials and observation of resultant changes in visible colors of transmitting light beams
Author(s): Seika Tokumitsu; Makoto Hasegawa
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Paper Abstract

When polarized white-color light beams are allowed to travel in an optically active material, coloration of the polarized light beams can be observed due to optical rotation phenomena of the material. If prediction of colors to be observed becomes possible, it will be advantageous for the purpose of investigations of the material. The authors previously succeeded in establishing a theoretical mathematical expression for realizing predictions of changes in the angle of rotation as well as resultant changes in visible colors of polarized white-color light beams transmitting in sugared water as an optically active material. In this study, for the purpose of confirming whether the mathematical expression is applicable for any other optically active materials, commercially available syrup was employed as the optically active material. The angle of rotation was first determined through measurements, and visible colors of transmitted light beams were observed. In addition, the spectra of transmitted light beams were also measured. On the other hand, the changes in visible colors were predicted by employing the authors’ mathematical expression. As a result, roughly satisfactory matchings were confirmed between the actually measured or observed results and the predictions. Thus, the mathematical expression is believed to be applicable for investigations of any other optically active materials. Such predictions in color changes will be advantageous in science and engineering education.

Paper Details

Date Published: 18 November 2019
PDF: 6 pages
Proc. SPIE 11189, Optical Metrology and Inspection for Industrial Applications VI, 1118912 (18 November 2019); doi: 10.1117/12.2537688
Show Author Affiliations
Seika Tokumitsu, Chitose Institute of Science and Technology (Japan)
Makoto Hasegawa, Chitose Institute of Science and Technology (Japan)


Published in SPIE Proceedings Vol. 11189:
Optical Metrology and Inspection for Industrial Applications VI
Sen Han; Toru Yoshizawa; Song Zhang; Benyong Chen, Editor(s)

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