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New calibration approach for 3D measurement system based on the light-source-stepping method
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Paper Abstract

In the 3D measurement system based on light-source-stepping method, phase shift changes with the depth of the object changes. The phase distribution recovered by N-step phase shifting method is distorted and then the recovered 3D shape is distorted. Fujigaki proposed the whole-space tabulation method to obtain 3D shape without distortion. The moving stage is used to calibrate the system and then the whole-space look-up tables are constructed. It is inconvenient to calibrate the measurement system. We proposed a new method to calibrate the system without moving stage. Firstly, the camera is calibrated by Zhang’s method. Secondly, a reference plane with sparse marks is placed at different depth of measurement volume. The fringes are projected on the plane and the images are captured at the same time. Thirdly, the phase of different depth is worked out by improved Fourier transform profilometry method. The phase of marker is estimated by local curve fitting. The image coordinates of markers are detected. The projection matrix from reference plane to image plane is worked out from the image coordinates and world coordinates of markers and the inner parameters of camera. The 3D coordinates of every pixel of reference plane are worked out from their image coordinates and the projection matrix. Fourthly, a whole-space look-up table is constructed. This method does not need precise moving stage to calibrate the relationship between phase and 3D coordinates. The hardware requirement for system calibration is simplified. Experiments are carried out to verify the proposed method.

Paper Details

Date Published: 18 November 2019
PDF: 9 pages
Proc. SPIE 11189, Optical Metrology and Inspection for Industrial Applications VI, 111891J (18 November 2019); doi: 10.1117/12.2537679
Show Author Affiliations
Yiteng Jiang, Zhejiang Normal Univ. (China)
State Key Lab. of Modern Optical Instrumentation (China)
Yong Li, Zhejiang Normal Univ. (China)
State Key Lab. of Modern Optical Instrumentation (China)
Kai Huang, Zhejiang Normal Univ. (China)
State Key Lab. of Modern Optical Instrumentation (China)
Xingcan Zhou, Zhejiang Normal Univ. (China)
State Key Lab. of Modern Optical Instrumentation (China)


Published in SPIE Proceedings Vol. 11189:
Optical Metrology and Inspection for Industrial Applications VI
Sen Han; Toru Yoshizawa; Song Zhang; Benyong Chen, Editor(s)

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