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Analysis of encoding aperture processing error for optical field modulation of compressed sampling spectrum imaging
Author(s): Mengjun Zhu; Xiaochun Wang; Junli Qi; Wusheng Tang; Meicheng Fu; Jinghan Pan; Mengzhu Li; Yanfang Guo; Wenjun Yi; Jubo Zhu; Xiujian Li
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Paper Abstract

The encoding aperture errors with different types and different degrees occurred during the process of encoding aperture by micro-Nano technology. The encoding aperture is a key component of the CSSI, and the analysis of errors in encoding aperture processing provides an important evidence for the CSSI. In this paper, based on the error occurring in the process of encoding aperture, the simulation is established by commercial software FDTD by which the optical field modulation of incident light in the CSSI system is analyzed by comparing the ideal encoding aperture and the error encoding aperture. The simulation results show that there is a significant difference in the optical intensity distribution of incident light modulated by a single error aperture and a single ideal aperture, the optical intensity distribution modulated by the ideal aperture has two distinct peaks at the aperture surface, and the optical intensity distribution modulated by the error aperture is approximately twice as large as by the ideal aperture; the optical intensity distribution modulated by the two type aperture has obvious peaks while leaving the aperture surface, and the optical intensity distribution modulated by the ideal aperture is approximately twice as large as by the error aperture; changing the number of pixels of the encoding aperture, the ideal encoding aperture and the error encoding aperture have little difference in modulation of the incident light; comparing the ideal aperture, as the increasing of the rounded radius of error aperture, the influence of the optical field distribution modulation becomes more obvious.

Paper Details

Date Published: 19 November 2019
PDF: 9 pages
Proc. SPIE 11186, Advanced Optical Imaging Technologies II, 1118617 (19 November 2019); doi: 10.1117/12.2537534
Show Author Affiliations
Mengjun Zhu, National Univ. of Defense Technology (China)
Xiaochun Wang, National Univ. of Defense Technology (China)
Junli Qi, National Univ. of Defense Technology (China)
Wusheng Tang, National Univ. of Defense Technology (China)
Meicheng Fu, National Univ. of Defense Technology (China)
Jinghan Pan, National Univ. of Defense Technology (China)
Mengzhu Li, National Univ. of Defense Technology (China)
Yanfang Guo, National Univ. of Defense Technology (China)
Wenjun Yi, National Univ. of Defense Technology (China)
Jubo Zhu, National Univ. of Defense Technology (China)
Xiujian Li, National Univ. of Defense Technology (China)


Published in SPIE Proceedings Vol. 11186:
Advanced Optical Imaging Technologies II
Xiao-Cong Yuan; P. Scott Carney; Kebin Shi; Michael G. Somekh, Editor(s)

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