Share Email Print

Proceedings Paper

Detect curing extent of conformal coating using speckle variance optical coherence tomography
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

Conformal coating is a protective coating widely used in printed circuit boards (PCBs), protecting PCBs from harsh environmental conditions. Its curing extent and thickness are the key factors, determining its protection performance. At present, the traditional method to evaluate the curing extent is metallographic section, which cuts PCB and images its cross-section under a microscope. However, it is destructive. In this study, we proposed to use optical coherence tomography (OCT) to evaluate the coating curing extent. Note that Brownian motion inside the conformal coating gets slower during curing process, leading to a smaller OCT intensity variation over time. Therefore, speckle variance (SV) of OCT imaging, which actually measures the OCT intensity variation, is expected to become smaller during the curing process and can be used to evaluate the curing extent over the whole imaging depth. To demonstrate the capability of SVOCT in detecting the curing extent of conformal coating, multiple OCT images were acquired at each curing status for SV calculation. The results show that the speckle variance of OCT image will gradually decrease during the curing process of conformal coating and eventually stabilize after the coating cures completely. This can be utilized to assess the curing extent of the conformal coating.

Paper Details

Date Published: 18 November 2019
PDF: 6 pages
Proc. SPIE 11189, Optical Metrology and Inspection for Industrial Applications VI, 111890C (18 November 2019); doi: 10.1117/12.2537491
Show Author Affiliations
Xiwen Wang, Soochow Univ. (China)
Qian Wu, Soochow Univ. (China)
Jie Zhu, Soochow Univ. (China)
Jianing Dai, Soochow Univ. (China)
Jianhua Mo, Soochow Univ. (China)

Published in SPIE Proceedings Vol. 11189:
Optical Metrology and Inspection for Industrial Applications VI
Sen Han; Toru Yoshizawa; Song Zhang; Benyong Chen, Editor(s)

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?