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Proceedings Paper

Inversion algorithm for detection of H2S gas concentration by differential absorption spectroscopy
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Paper Abstract

The traditional differential absorption spectroscopy method has simple detection principle for H2S gas concentration detection, accurate detection and fast reaction speed, but it will produce large errors in low concentration and short optical path environment. Differential absorption spectroscopy requires a very complex super-definite equation to solve for concentration, which is easy to generate solution errors. Based on the traditional differential absorption algorithm, this paper uses genetic algorithm to invert low-concentration H2S gas, but the genetic algorithm is prone to premature convergence and thus falls into local optimum. A genetic algorithm based on catastrophe optimization is designed to retrieve H2S gas concentration. The use of catastrophic will significantly improve the ability of the algorithm to develop in the solution space. By preserving the local optimal solution obtained before the disaster, the algorithm can be avoided as a random search, which ensures the stability of the algorithm. The optimization of the differential absorption algorithm mainly includes data acquisition, data processing and data presentation. Data acquisition is the collection of changes that occur after gas molecules absorb photons. Data processing is based on the collected data and the optimization algorithm to calculate the optimal concentration. The data presentation is to display the calculated concentration on the computer. The concentration of H2S gas was inversed by the traditional DOAS algorithm and the optimized DOAS algorithm. The results were compared. The results show that the method has high measurement accuracy for low concentration H2S gas, and combines with traditional differential absorption spectroscopy to obtain a wider measurement range.

Paper Details

Date Published: 18 November 2019
PDF: 8 pages
Proc. SPIE 11189, Optical Metrology and Inspection for Industrial Applications VI, 111891C (18 November 2019); doi: 10.1117/12.2537471
Show Author Affiliations
Shu wang Chen, Hebei Univ. of Science and Technology (China)
Xiao wei Yin, Hebei Univ. of Science and Technology (China)
Zhen zhen Wang, Hebei Univ. of Science and Technology (China)
Tong tong Song, Hebei Univ. of Science and Technology (China)
Shuli Song, Hebei Univ. of Science and Technology (China)


Published in SPIE Proceedings Vol. 11189:
Optical Metrology and Inspection for Industrial Applications VI
Sen Han; Toru Yoshizawa; Song Zhang; Benyong Chen, Editor(s)

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