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Proceedings Paper

System construction and uncertainty evaluation of absolute measurement of infrared spectral radiance
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Paper Abstract

The absolute measurement of infrared spectral radiance is very important for optical radiometry. In this paper, a system for absolute measurement of infrared spectral radiance is built up. The system consists of fixed-point blackbody sources, a variable temperature blackbody, a radiant source to be measured, Fourier Transform Infrared Radiometer (FTIR), relay optical system, non-contact infrared thermometer and so on. The emissivity of the variable temperature blackbody is 0.999; the temperature range is 50°C ~ 1050°C. The emissivity of the radiant source to be measured is larger than 0.995; the temperature range is 30°C ~ 550°C. The variable temperature blackbody source was calibrated and can be traced to the fixed-point blackbody source. In experiment, it was used as the standard radiant source. The spectral range of this system is 3 μm ~ 14 μm. A serial of experiments have been implemented to analyze the uncertainty of each component, including the repeatability, size-of-source effect, stability, uniformity and so on. To improve the system’s uncertainty, we have suppressed stray radiation and optimized optical system by installing a water-cooled aperture and a field stop at the entrance of the optical system and before the FTIR, respectively; optimizing the system based on optical simulation and replacing the reflective mirrors with one off-axis parabolic mirror. Next step, we will re-evaluate the uncertainty of the improved system.

Paper Details

Date Published: 18 November 2019
PDF: 7 pages
Proc. SPIE 11189, Optical Metrology and Inspection for Industrial Applications VI, 111891A (18 November 2019); doi: 10.1117/12.2537206
Show Author Affiliations
Shufang He, National Institute of Metrology (China)
Yanfei Wang, National Institute of Metrology (China)
Caihong Dai, National Institute of Metrology (China)
Jinyuan Liu, National Institute of Metrology (China)
Guojin Feng, National Institute of Metrology (China)


Published in SPIE Proceedings Vol. 11189:
Optical Metrology and Inspection for Industrial Applications VI
Sen Han; Toru Yoshizawa; Song Zhang; Benyong Chen, Editor(s)

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