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Proceedings Paper

Instantaneous wavefront measurement based on deflectometry
Author(s): Zhongming Xie; Daodang Wang; Hanting Gu; Ming Kong; Rongguang Liang; Wentao Zhang
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Paper Abstract

The deflectometry enables high-precision wavefront measurement with large dynamic range. Traditional multi-step phase-shifting fringe-illumination deflectometric methods involve at least three sinusoidal phase-shifting fringe patterns and require a sequential projection, making it not feasible for the instantaneous measurement. In this paper, a colorcoded method with frequency-carrier patterns is proposed to achieve the instantaneous wavefront measurement based on deflectometry. With the color extraction from different channels, composite patterns in x and y directions can be well separated with a single shot. Then, the phase-shifting patterns encoded in different frequencies can be demodulated with the designed filters, by which the local wavefront slopes can be obtained simultaneously to reconstruct the wavefront under test. Both the numerical simulation and experiments are performed to validate the feasibility of proposed method. The proposed method provides a feasible way for the real-time and instantaneous measurement with large dynamic range based on deflectometry.

Paper Details

Date Published: 19 November 2019
PDF: 7 pages
Proc. SPIE 11185, Optical Design and Testing IX, 111850Q (19 November 2019); doi: 10.1117/12.2537148
Show Author Affiliations
Zhongming Xie, China Jiliang Univ. (China)
Daodang Wang, China Jiliang Univ. (China)
Hanting Gu, China Jiliang Univ. (China)
Ming Kong, China Jiliang Univ. (China)
Rongguang Liang, James C. Wyant College of Optical Sciences, Univ. of Arizon (United States)
Wentao Zhang, Guilin Univ. of Electronic Technology (China)

Published in SPIE Proceedings Vol. 11185:
Optical Design and Testing IX
Yongtian Wang; Pablo Benítez; Osamu Matoba, Editor(s)

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