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Proceedings Paper

Analysis of metrological properties of the measurement system to study changes in the resistance of nanocomposite carbon-palladium thin films under the influence of hydrogen
Author(s): S. Krawczyk
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Paper Abstract

Nanocomposite carbon-palladium thin films were prepared by PVD method on ceramic (Al2O3) substrates by our group at Tele & Research Institute in Warsaw. Resistance of these films changed under the influence of hydrogen at different concentration of this gas. Set-up for measurements of resistance changes due to gas influence was designed and built. The set-up is composed of measurement chamber, gas flow controllers, valves and specially devoted to this experiment computer system with SkSysM program developed by the author. In this paper, the measurement system and its metrological properties are described. The uncertainty of measurement of the system during experimental procedure of resistance changes measurements for C-Pd films under influence of hydrogen is described. The uncertainty of measurements, illustrated with the experimental errors for dynamic and static conditions of experiment is also discussed.

Paper Details

Date Published: 6 November 2019
PDF: 7 pages
Proc. SPIE 11176, Photonics Applications in Astronomy, Communications, Industry, and High-Energy Physics Experiments 2019, 111764V (6 November 2019); doi: 10.1117/12.2536684
Show Author Affiliations
S. Krawczyk, Tele & Radio Research Institute (Poland)


Published in SPIE Proceedings Vol. 11176:
Photonics Applications in Astronomy, Communications, Industry, and High-Energy Physics Experiments 2019
Ryszard S. Romaniuk; Maciej Linczuk, Editor(s)

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