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Proceedings Paper

The output signal of the broadband differential interferometer as a function of the thickness of the single-mode optical waveguide
Author(s): Kazimierz Gut
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Paper Abstract

The paper presents an analysis of planar broadband waveguide interferometers in the case of a change in layer thickness. The analysis was performed for the wavelength range of 450nm-1200nm. The TE0 and TM0 orthogonal modes which propagate in this wavelength range are considered. At the output of the system, an interference signal behind a polarizer can be recorded. If a spectrometer is used as a detector, the recorded signal is a function of the wavelength. Change in the change thickness of the waveguide layers results in a change of the recorded signal shape.

Paper Details

Date Published: 13 September 2019
PDF: 6 pages
Proc. SPIE 11204, 14th Conference on Integrated Optics: Sensors, Sensing Structures, and Methods, 1120408 (13 September 2019); doi: 10.1117/12.2536658
Show Author Affiliations
Kazimierz Gut, Silesian Univ. of Technology (Poland)


Published in SPIE Proceedings Vol. 11204:
14th Conference on Integrated Optics: Sensors, Sensing Structures, and Methods
Przemyslaw Struk; Tadeusz Pustelny, Editor(s)

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