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ESD problems in embedded systems
Author(s): K. Krosman; J. Sosnowski
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Paper Abstract

Mitigating failures caused by electrostatic discharge (ESD) is a crucial problem in many applications of embedded systems. The paper analyses in a systematic way the propagation of ESD effects at structural and logical levels in order to find threats and capabilities of efficient system recovery. The presented considerations are illustrated with some results referred to commercially developed devices for registering and analyzing ECG signals.

Paper Details

Date Published: 6 November 2019
PDF: 8 pages
Proc. SPIE 11176, Photonics Applications in Astronomy, Communications, Industry, and High-Energy Physics Experiments 2019, 111761V (6 November 2019); doi: 10.1117/12.2536623
Show Author Affiliations
K. Krosman, Warsaw Univ. of Technology (Poland)
J. Sosnowski, Warsaw Univ. of Technology (Poland)


Published in SPIE Proceedings Vol. 11176:
Photonics Applications in Astronomy, Communications, Industry, and High-Energy Physics Experiments 2019
Ryszard S. Romaniuk; Maciej Linczuk, Editor(s)

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