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Proceedings Paper

Improved x-ray fluorescent wavelength dispersive spectrometer
Author(s): Mykola H. Tarnovskyi; Gennadii D. Doroshchenkov; Grigorii P. Pustovit; Krzysztof Skorupski
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Paper Abstract

The principles of construction of various types of spectrometers used for x-ray fluorescence are considered, their advantages and disadvantages are analyzed. An approach to the implementation of the wavelength dispersive spectrometer is proposed, which allows to reduce the time of spectral analysis in the entire range of the x-ray fluorescence.

Paper Details

Date Published: 6 November 2019
PDF: 6 pages
Proc. SPIE 11176, Photonics Applications in Astronomy, Communications, Industry, and High-Energy Physics Experiments 2019, 111760A (6 November 2019); doi: 10.1117/12.2536609
Show Author Affiliations
Mykola H. Tarnovskyi, Vinnytsia National Technical Univ. (Ukraine)
Gennadii D. Doroshchenkov, Vinnytsia National Technical Univ. (Ukraine)
Grigorii P. Pustovit, Rivne Regional Institute of Postgraduate Education (Ukraine)
Krzysztof Skorupski, Lublin Univ. of Technology (Poland)


Published in SPIE Proceedings Vol. 11176:
Photonics Applications in Astronomy, Communications, Industry, and High-Energy Physics Experiments 2019
Ryszard S. Romaniuk; Maciej Linczuk, Editor(s)

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