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Step-index sapphire fiber and its application in a terahertz near-field microscopy
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Paper Abstract

In this paper, we present the step-index sapphire fiber, applied as a THz probe. The low THz attenuation of sapphire makes it attractive for fabrication of THz optical components. Moreover, it has a high refractive index in THz range, which guarantees a strong modal confinement in a fiber core. The advantages of the edge-defined film-fed growth (EFG) technique allow for fabrication of fibers with close-to-cylindrical shape, the length of 1 m and longer, and the subwavelength diameter of 150 − 400 μm. In order to improve the coupling efficiency, the fiber has polished flat ends. We apply the fabricated 300-μm-diameter sapphire fiber for the THz near-field scanning-probe microscopy. The spatial resolution of our experimental setup is defined by the fiber diameter, thus, it reaches ~ λ/4 for the radiation wavelength λ = 1200 μm. The obtained images of the test objects demonstrate the advanced resolution, which is close to the theoretical limit and beyond the Abbe diffraction limit.

Paper Details

Date Published: 18 October 2019
PDF: 7 pages
Proc. SPIE 11164, Millimetre Wave and Terahertz Sensors and Technology XII, 111640G (18 October 2019); doi: 10.1117/12.2536305
Show Author Affiliations
G. M. Katyba, Institute of Solid State Physics (Russian Federation)
A.M. Prokhorov General Physics Institute (Russian Federation)
Bauman Moscow State Technical Univ. (Russian Federation)
N. V. Chernomyrdin, A.M. Prokhorov General Physics Institute (Russian Federation)
Bauman Moscow State Technical Univ. (Russian Federation)
I. N. Dolganova, Institute of Solid State Physics (Russian Federation)
Bauman Moscow State Technical Univ. (Russian Federation)
A. A. Pronin, A.M. Prokhorov General Physics Institute (Russian Federation)
I. V. Minin, Tomsk State Univ. (Russian Federation)
Tomsk Politechnical Univ. (Russian Federation)
O. V. Minin, Tomsk State Univ. (Russian Federation)
Tomsk Politechnical Univ. (Russian Federation)
K. I. Zaytsev, A.M. Prokhorov General Physics Institute (Russian Federation)
Bauman Moscow State Technical Univ. (Russian Federation)
V. N. Kurlov, Institute of Solid State Physics (Russian Federation)


Published in SPIE Proceedings Vol. 11164:
Millimetre Wave and Terahertz Sensors and Technology XII
Neil A. Salmon; Frank Gumbmann, Editor(s)

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