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Proceedings Paper • Open Access

Tailored dispersive elements for adapted spectrometric sensing
Author(s): Torsten Diehl; Peter Triebel; Tobias Moeller; Alexandre Gatto; Dennis Lehr; Alexander Pesch; Lars H. Erdmann; Matthias Burkhardt; Alexander Kalies; Felix Koch

Paper Abstract

Dispersive elements are in general the key components of spectrometers and define mainly their performance. Prisms and filters are typically used for lower resolution applications, e.g. color measurement for industrial applications. Many high performance spectrometer applications are using gratings as dispersive elements instead. Different spectrometer layouts require various grating approaches in order to maintain the optical imaging performance. A frequent aim is a progressively optimization of the optical performance in balance to the mechanical parameters like weight, volume or robustness against variations of environmental conditions of a spectrometer module as well. Thus, the optical designer has to draw on additional design degrees of freedom. This in turn results often in more and more complex grating types featuring curved substrates and/or variable and bended grating lines. Especially the trend toward hyperspectral imaging applications demands appropriate options for enhanced field correction. The main ZEISS technology chain for grating manufacturing includes holography and reactive ion etching is a flexible base for these special types of gratings. A close entanglement between holography and accurate test procedures for the optical functionality of the holographic grating is a pre-condition for the ability to meet the often challenging specifications. Therefore, beside the brief description of the manufacturing technology in this text we show a set of newly developed measuring procedures supporting the holographic surface patterning approach.

Paper Details

Date Published: 12 July 2019
PDF: 8 pages
Proc. SPIE 11180, International Conference on Space Optics — ICSO 2018, 111801K (12 July 2019); doi: 10.1117/12.2535975
Show Author Affiliations
Torsten Diehl, Carl Zeiss Spectroscopy GmbH (Germany)
Peter Triebel, Carl Zeiss Spectroscopy GmbH (Germany)
Tobias Moeller, Carl Zeiss Spectroscopy GmbH (Germany)
Alexandre Gatto, Carl Zeiss Jena GmbH (Germany)
Dennis Lehr, Carl Zeiss Jena GmbH (Germany)
Alexander Pesch, Carl Zeiss Jena GmbH (Germany)
Lars H. Erdmann, Carl Zeiss Jena GmbH (Germany)
Matthias Burkhardt, Carl Zeiss Jena GmbH (Germany)
Alexander Kalies, Carl Zeiss Jena GmbH (Germany)
Felix Koch, Carl Zeiss Jena GmbH (Germany)

Published in SPIE Proceedings Vol. 11180:
International Conference on Space Optics — ICSO 2018
Zoran Sodnik; Nikos Karafolas; Bruno Cugny, Editor(s)

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