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Proceedings Paper

New aspects on the interpretation of Z-scan data
Author(s): Daniel G. McLean; Paul A. Fleitz; Richard L. Sutherland
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Paper Abstract

Z-scan profiles very different than the typical peak-valley signatures have been observed. In the closed over open ratio data, a feature centered around z equals 0 and with normalized transmission greater than 1 has been observed in three classes of materials. Experimental artifacts are ruled out. In one class, tolane melts, the usual peak and valley signature is not observed even at low irradiances. In the other two material classes, C60 fullerene solutions and benzophenone-thiophene polymer solutions, the usual signature is observed at low irradiances. A model based on the Gaussian decomposition method is used to interpret the data. This analysis leads to the interpretation of the observations as a diffractive effect arising from the distorted amplitude profile due to nonlinear absorption.

Paper Details

Date Published: 7 October 1996
PDF: 10 pages
Proc. SPIE 2853, Nonlinear Optical Liquids, (7 October 1996); doi: 10.1117/12.253481
Show Author Affiliations
Daniel G. McLean, Air Force Wright Lab. (United States)
Paul A. Fleitz, Air Force Wright Lab. (United States)
Richard L. Sutherland, Air Force Wright Lab. (United States)

Published in SPIE Proceedings Vol. 2853:
Nonlinear Optical Liquids
Christopher M. Lawson, Editor(s)

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