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Proceedings Paper • Open Access

Physically based synthetic image generation for machine learning: a review of pertinent literature
Author(s): Dominik Schraml

Paper Abstract

The term deep learning is almost on everyone's lips these days, in the area of computer vision manly because of the great advances deep learning approaches have made amongst others in object detection and classification. For general object location or classification tasks there do exist several giant databases containing several millions of labeled images and several thousands of different labels like COCO and ImageNet. In contrast in industrial applications like quality inspection there do hardly ever exist such training data not only for reasons of confidentiality of trade secrets. An obvious way to remedy this deficiency is the synthetic creation of image data. Physically based rendering attempts to achieve photorealistic images by accurately simulating the ow of light of the real world according to various physical laws. Therefor multiple techniques like Ray Tracing and Path Tracing have been implemented and are becoming increasingly widespread as hardware performance increases. The intent of this article is to give a wide but nevertheless preferably comprehensive overview which approaches have been pursued in recent literature to generate realistic synthetic training images. The development of various rendering methods from rasterization to bidirectional Monte Carlo path tracing is outlined, as well as their differences and use. Along with the terminology a few mathematical foundations like the Bidirectional Reflectance Distribution Function (BRDF) are briefly described. Altogether specially concern is given to industrial data and quality control, comparing literature and the practical application of its results.

Paper Details

Date Published: 17 September 2019
PDF: 13 pages
Proc. SPIE 11144, Photonics and Education in Measurement Science 2019, 111440J (17 September 2019); doi: 10.1117/12.2533485
Show Author Affiliations
Dominik Schraml, Steinbeis Qualitätssicherung und Bildverarbeitung GmbH (Germany)

Published in SPIE Proceedings Vol. 11144:
Photonics and Education in Measurement Science 2019
Maik Rosenberger; Paul-Gerald Dittrich; Bernhard Zagar, Editor(s)

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