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Proceedings Paper

Simulation of the effect of noise on terahertz digital holography reconstructed image
Author(s): Ping Lin; Qi Li; Zuochun Shen
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Paper Abstract

In the terahertz imaging experiments, target is often embedded in a support plate (such as PTFE, etc.). Background noise will be caused by many factors, such as uneven material and non-smoothness of support plate. In this paper, the impacts of noise on terahertz in-line digital holography single-exposure, support-domain constrained phase retrieval algorithm and its reconstructed results are simulated. The support domain is determined by the combination of the Otsu algorithm and the opening and closing operation. Firstly, the influences of noise on 2.52 terahertz in-line digital holographic reconstruction are studied when the transmittance of support plate is 0.93. The mean value of Gaussian noise of the support plate is 0, and the standard deviation range is between 0 and 0.1, and the interval is 0.005. Mean square error (MSE) and peak signal-to-noise ratio (PSNR) are used as the evaluation criteria. Finally, the Gaussian noise with mean value of 0 and standard deviation of 0.04 is selected to simulate and analyze the effect of the reconstructed image with different transmittances. The results show that, when the transmittance of the support plate is 0.93 and the noise standard deviation is 0-0.04, the peak signal-to-noise ratio is less than 6% lower than of the ideal support plate reconstruction.

Paper Details

Date Published: 17 May 2019
PDF: 8 pages
Proc. SPIE 11170, 14th National Conference on Laser Technology and Optoelectronics (LTO 2019), 111701F (17 May 2019); doi: 10.1117/12.2533398
Show Author Affiliations
Ping Lin, Harbin Institute of Technology (China)
Qi Li, Harbin Institute of Technology (China)
Zuochun Shen, Harbin Institute of Technology (China)

Published in SPIE Proceedings Vol. 11170:
14th National Conference on Laser Technology and Optoelectronics (LTO 2019)
Jianqiang Zhu; Weibiao Chen; Zhenxi Zhang; Minlin Zhong; Pu Wang; Jianrong Qiu, Editor(s)

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