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Further investigation on laser-induced damage thresholds of camera sensors and micro-optomechanical systems
Author(s): Bastian Schwarz; Michael Koerber; Gunnar Ritt; Bernd Eberle
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Paper Abstract

Based on our previous work1, we further investigate the laser-induced damage effects on digital micromirror devices (DMD) in comparison to different electro-optical imaging sensors such as complementary metal-oxide-semiconductors (CMOS) and charge-coupled devices (CCD). In our earlier work, we reported on damage thresholds obtained by pulsed laser radiation of nanosecond pulse width and by continuous-wave laser radiation utilizing irradiation times ranging from 250 milliseconds up to 10 seconds. The main objective of our current work is to fill the gap regarding the time scale of picosecond pulses. In the course of this research, we enhanced the experimental setup and we explicitly describe the achieved improvements in this work. Furthermore, we characterize the damage caused by laser pulse energies exceeding the laser-induced damage threshold (LIDT).

Paper Details

Date Published: 7 October 2019
PDF: 13 pages
Proc. SPIE 11161, Technologies for Optical Countermeasures XVI, 111610A (7 October 2019); doi: 10.1117/12.2533142
Show Author Affiliations
Bastian Schwarz, Fraunhofer-Institut für Optronik, Systemtechnik und Bildauswertung IOSB (Germany)
Michael Koerber, Fraunhofer-Institut für Optronik, Systemtechnik und Bildauswertung IOSB (Germany)
Gunnar Ritt, Fraunhofer-Institut für Optronik, Systemtechnik und Bildauswertung IOSB (Germany)
Bernd Eberle, Fraunhofer-Institut für Optronik, Systemtechnik und Bildauswertung IOSB (Germany)


Published in SPIE Proceedings Vol. 11161:
Technologies for Optical Countermeasures XVI
David H. Titterton; Robert J. Grasso; Mark A. Richardson, Editor(s)

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