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A rapid dual-band infrared detection method for aerial targets based on LCM
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Paper Abstract

Targets detection in single band images has problems such as poor clutter suppression capability and high false alarm rate, while the difference in imaging characteristics of the aerial target between the mid-length wave and the long-length wave is obvious and complementary, so dual-bands fusion can be utilized to improve detection efficiency and performance. An rapid infrared dual-band fusion target detection method based on local contrast method (LCM) is proposed, searching targets rapidly and extracting targets features in the mid-length wave images from same scene, finally fusing two bands images for precise positioning. The multi-scales LCM is used to quickly perform full-image range background suppression and target enhancement in lower-resolution long-length wave images, then the suspicious target position is obtained and sliced. Following the guidance from the long-length wave images, the position of targets is extracted at the corresponding position in the higher-resolution mid-length wave image. Two positions from different resolution images are fused, and the target is accurately positioned. This method achieves rapid detection of aerial targets in infrared images effectively, which has certain engineering application value.

Paper Details

Date Published: 17 October 2019
PDF: 8 pages
Proc. SPIE 11158, Target and Background Signatures V, 1115803 (17 October 2019); doi: 10.1117/12.2533099
Show Author Affiliations
Lue Chen, Key Lab. of Intelligent Infrared Perception (China)
Shanghai Institute of Technical Physics (China)
Univ. of Chinese Academy of Sciences (China)
Xin Chen, Key Lab. of Intelligent Infrared Perception (China)
Shanghai Institute of Technical Physics (China)
Yueqi Su, Shanghai Institute of Technical Physics (China)
Fuxing Lu, Key Lab. of Intelligent Infrared Perception (China)
Shanghai Institute of Technical Physics (China)
Univ. of Chinese Academy of Sciences (China)
Peng Rao, Key Lab. of Intelligent Infrared Perception (China)
Shanghai Institute of Technical Physics (China)


Published in SPIE Proceedings Vol. 11158:
Target and Background Signatures V
Karin U. Stein; Ric Schleijpen, Editor(s)

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