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Proceedings Paper

Target infrared characteristic measurement in vacuum chamber
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Paper Abstract

Orbit target IR characteristic is the basis of the IR imaging detection equipment design, the corresponding digital simulation model validation, and the application processing development, such as the target detection and tracking. In the work, an infrared measurement system for simulated space target is represented. The system can acquire the infrared characteristics of the target in the simulated space environment on the ground. In order to simulate the whole orbit environment, vacuum chamber and solar simulator are used in the work. An IR window is developed for the system. Then measurement instruments can be place outside the chamber to get the characteristic through the IR window. The work also provides a method to calibrate the IR window. The IR characteristic at the wavelength range of 3 μ~12 μm can be obtained with the system.

Paper Details

Date Published: 17 October 2019
PDF: 6 pages
Proc. SPIE 11158, Target and Background Signatures V, 111580F (17 October 2019);
Show Author Affiliations
Dongxing Tao, Beijing Institute of Spacecraft Environment Engineering (China)
Zhe Gong, China Academy of Space Technology (China)
Qinliang Guo, Beijing Institute of Spacecraft Environment Engineering (China)
Yanqiang Bi, Beijing Institute of Spacecraft Environment Engineering (China)
Yonghong Shang, Beijing Institute of Spacecraft Environment Engineering (China)
Peiyin Li, Beijing Institute of Spacecraft Environment Engineering (China)
Shuo Liang, Beijing Institute of Spacecraft Environment Engineering (China)
Shanping Jiang, Beijing Institute of Spacecraft Environment Engineering (China)
Jing Wang, Beijing Institute of Spacecraft Environment Engineering (China)


Published in SPIE Proceedings Vol. 11158:
Target and Background Signatures V
Karin U. Stein; Ric Schleijpen, Editor(s)

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