Share Email Print
cover

Proceedings Paper

Approaches to solve inverse problems for optical sensing around corners
Author(s): Martin Laurenzis; Jonathan Klein; Emmanuel Bacher; Stephane Schertzer
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

Optically non-line-of-sight sensing or seeing around the corner is a computational imaging approach describing a classical inverse problem where information about a hidden scene has to be reconstructed from a set of indirect measurements. In the last decade, this field has been intensively studied by different groups, using several sensory and reconstruction approaches. We focus on active sensing with two main concepts: The reconstruction of reflective surfaces by back-projection of time-of-flight data and a six degree-of-freedom tracking of a rigid body from intensity images using an analysis-by-synthesis method. In the first case, the inverse problem can be approximately solved by back-projection of the transient data to obtain a geometrical shape of the hidden scene. Using intensity images, only the diffusely reflected blurred intensity distribution and no time information is recorded. This problem can be solved by an analysis-of-synthesis approach.

Paper Details

Date Published: 16 October 2019
PDF: 7 pages
Proc. SPIE 11163, Emerging Imaging and Sensing Technologies for Security and Defence IV, 1116304 (16 October 2019);
Show Author Affiliations
Martin Laurenzis, French-German Research Institute of Saint-Louis (France)
Jonathan Klein, French-German Research Institute of Saint-Louis (France)
Univ. Bonn (Germany)
Emmanuel Bacher, French-German Research Institute of Saint-Louis (France)
Stephane Schertzer, French-German Research Institute of Saint-Louis (France)


Published in SPIE Proceedings Vol. 11163:
Emerging Imaging and Sensing Technologies for Security and Defence IV
Gerald S. Buller; Richard C. Hollins; Robert A. Lamb; Martin Laurenzis, Editor(s)

© SPIE. Terms of Use
Back to Top
PREMIUM CONTENT
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?
close_icon_gray