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Proceedings Paper

New fabrication method of step plate for measuring instrument transfer function of interferometer
Author(s): Longbo Xu; You Zhou; Rihong Zhu; Yunbo Bai; Shijie Liu
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Paper Abstract

Phase step plate has the property of step function, and it can be used to measure the interferometer system transfer function (ITF), which is used to objectively evaluate interferometer spatial frequency response characteristics. The traditional fabrication method of step plate is lithographic exposure combined with reactive ion beam etching method, which is costive, and not suitable for fabricating large diameter step plate. In this paper, a new fabrication method of step plate based on blade-mask coating technology is proposed. A step plate of 100mm diameter and 103.5nm step height is successfully fabricated, and the surface roughness, homogeneity, steepness of the step plate are satisfied for measurement requirements. Furthermore, the coated step plate is used to measure the ITF compared with an etched step plate, and the measurement results of two plates differ by no more than 5%, which shows a good consistency. Thus, the reliability of coated step plate for ITF measurements is proved.

Paper Details

Date Published: 10 May 2019
PDF: 7 pages
Proc. SPIE 11068, Second Symposium on Novel Technology of X-Ray Imaging, 110682U (10 May 2019);
Show Author Affiliations
Longbo Xu, Nanjing Univ. of Science and Technology (China)
You Zhou, Shanghai Institute of Optics and Fine Mechanics (China)
Rihong Zhu, Nanjing Univ. of Science and Technology (China)
Yunbo Bai, Shanghai Institute of Optics and Fine Mechanics (China)
Shijie Liu, Shanghai Institute of Optics and Fine Mechanics (China)


Published in SPIE Proceedings Vol. 11068:
Second Symposium on Novel Technology of X-Ray Imaging
Yangchao Tian; Tiqiao Xiao; Peng Liu, Editor(s)

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