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Proceedings Paper

Design of light receiver system for measurement of resonance Raman spectra in deep ultraviolet wavelength region
Author(s): Shuzo Eto; Yuji Ichikawa; Masakazu Ogita; Ippei Asahi
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Paper Abstract

We are developing the remote measurement system for detecting harmful substances such as nitrogen dioxide and chemical materials using the resonance Raman scattering effect. Although the most remote measurement systems were designed to use the light from ultraviolet to visible wavelengths region, the characteristic Raman spectra of complex materials were observed in deep-ultraviolet (DUV) wavelengths region. The development of the standoff detection system by measuring the DUV light contributes to identify the various materials remotely. In this study, the design results of the Raman scattering light receiving equipment (light receiving system) consisting of telescope, relay optical system and spectrometer were considered. The optical design of the light receiving system was performed based on the estimation model of the signal-to-noise ratio (SNR) and the ray tracing method. The important parameters (the attenuation of the laser pulse and Raman light in the atmosphere, the amplification factor of the scattering cross section in DUV wavelength region etc.) are included in the model, and SNR of the Raman spectrum can be evaluated by changing each parameter. The estimation results suggest that SNR depends strongly on the reflectance of mirror and the amplification factor of the scattering cross section in DUV wavelength region. The durability test of the mirror has been performed to evaluate the use in outdoor. The results show that the mirrors with high reflectance in DUV wavelength region have enough tolerance to the temperature change and the scratch.

Paper Details

Date Published: 10 October 2019
PDF: 7 pages
Proc. SPIE 11160, Electro-Optical Remote Sensing XIII, 111600G (10 October 2019); doi: 10.1117/12.2532521
Show Author Affiliations
Shuzo Eto, Central Research Institute of Electric Power Industry (Japan)
Yuji Ichikawa, Shikoku Research Institute Inc. (Japan)
Masakazu Ogita, Shikoku Research Institute Inc. (Japan)
Ippei Asahi, Shikoku Research Institute Inc. (Japan)

Published in SPIE Proceedings Vol. 11160:
Electro-Optical Remote Sensing XIII
Gary W. Kamerman; Ove Steinvall, Editor(s)

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