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FDTD-modelling of terahertz solid immersion microscopy
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Paper Abstract

Terahertz (THz) solid immersion microscopy is a novel THz imaging modality, which provides both a sub- wavelength spatial resolution and a high energy efficiency, thanks to the absence of sub-wavelength apertures and probes in an optical scheme. In this work, we apply the finite-difference time-domain technique for solving the Maxwell's equations in order to analyze the performance of our original THz SIL arrangement. Namely, we estimate the theoretical limits for the spatial resolution and the depth of field of our optical system, as well as specify the confidential intervals for the alignment of optical elements. The observed results demonstrate the resolution of 0:15λ and the depth of field of 0:12λ(λ is an electromagnetic wavelength), justifying advanced performance of our THz SIL.

Paper Details

Date Published: 18 October 2019
PDF: 7 pages
Proc. SPIE 11164, Millimetre Wave and Terahertz Sensors and Technology XII, 111640H (18 October 2019); doi: 10.1117/12.2532389
Show Author Affiliations
V. A. Zhelnov, A.M. Prokhorov General Physics Institute (Russian Federation)
Bauman Moscow State Technical Univ. (Russian Federation)
N. V. Chernomyrdin, A.M. Prokhorov General Physics Institute (Russian Federation)
Bauman Moscow State Technical Univ. (Russian Federation)
A. S. Kucheryavenko, A.M. Prokhorov General Physics Institute (Russian Federation)
Bauman Moscow State Technical Univ. (Russian Federation)
I. N. Dolganova, Bauman Moscow State Technical Univ. (Russian Federation)
Insitute of Solid State Physics (Russian Federation)
G. M. Katyba, Bauman Moscow State Technical Univ. (Russian Federation)
Institute of Solid State Physics (Russian Federation)
K. I. Zaytsev, A.M. Prokhorov General Physics Institute (Russian Federation)
Bauman Moscow State Technical Univ. (Russian Federation)


Published in SPIE Proceedings Vol. 11164:
Millimetre Wave and Terahertz Sensors and Technology XII
Neil A. Salmon; Frank Gumbmann, Editor(s)

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