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Proceedings Paper

Photodetector array target calibration technology
Author(s): XiuQing Cai; FengFu Tan; Yi Wu; ZaiHong Hou; LaiAn Qin; Xu Jing; Feng He; SiLong Zhang; ShouChuan Zhang
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Paper Abstract

In order to achieve quantitative measurement of the spatial and temporal distribution of far-field laser spot, it is necessary to solve the calibration problem of the photodetector array target measurement system. For the photodetector array target calibration system, the unit detector is scanned one by one, and the unit detector is regarded as a black box. Its input and output correspond to the voltage pulse amplitude and the energy density of the laser beam respectively, in order to meet the energy density. The measured value of the measured value and the actual value of the project indicator, the segmentation relationship between the energy density of the photodetector and the amplitude of the voltage pulse is derived. The verification test shows that the error of the energy density measurement and the calibration true value of the verification test is less than 15% at a small energy density, and the error is less than 10% at a larger energy density. This calibration method has the advantages of simple operation and high calibration accuracy, and has guiding significance for future photodetector array target calibration technology.

Paper Details

Date Published: 17 May 2019
PDF: 7 pages
Proc. SPIE 11170, 14th National Conference on Laser Technology and Optoelectronics (LTO 2019), 111700I (17 May 2019);
Show Author Affiliations
XiuQing Cai, Univ. of Science and Technology of China (China)
FengFu Tan, Anhui Institute of Optics and Fine Mechanics (China)
Yi Wu, Anhui Institute of Optics and Fine Mechanics (China)
ZaiHong Hou, Anhui Institute of Optics and Fine Mechanics (China)
LaiAn Qin, Anhui Institute of Optics and Fine Mechanics (China)
Xu Jing, Anhui Institute of Optics and Fine Mechanics (China)
Feng He, Anhui Institute of Optics and Fine Mechanics (China)
SiLong Zhang, Anhui Institute of Optics and Fine Mechanics (China)
ShouChuan Zhang, Anhui Institute of Optics and Fine Mechanics (China)


Published in SPIE Proceedings Vol. 11170:
14th National Conference on Laser Technology and Optoelectronics (LTO 2019)
Jianqiang Zhu; Weibiao Chen; Zhenxi Zhang; Minlin Zhong; Pu Wang; Jianrong Qiu, Editor(s)

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