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Lab-scale soft x-ray ptychography: advanced nanoscale imaging and beam diagnostics
Author(s): M. Zürch; F. Tuitje; T. Helk; J. Gautier; F. Tissandier; J. -P. Goddet; E. Oliva; A. Guggenmos; U. Kleineberg; H. Stiel; S. Sebban; C. Spielmann
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Paper Abstract

X-ray microscopy has proven its advantages for resolving nanoscale objects. High Harmonic Generation (HHG) sources allow performing nanoimaging experiments at the lab scale and their femtosecond pulse duration and synchrony to an optical laser renders them useful for studying dynamic processes. HHG sources regularly provide high average photon flux but relatively low single-shot flux limiting time-resolved applications to adiabatic processes. Here, we show that soft X-ray lasers (SXRL) in turn provide high flux due to an X-ray lasing transition, but the coherence of an SXRL operating in the amplified-spontaneous-emission scheme is limited. The coherence properties of an SXRL seeded by an HHG source can be significantly improved allowing single-shot nanoscale imaging. In combination with ptychography, source properties are measured with high fidelity. This is applied to study the plasma dynamics of SXRL amplification in unprecedented quality.

Paper Details

Date Published: 9 September 2019
PDF: 6 pages
Proc. SPIE 11111, X-Ray Lasers and Coherent X-Ray Sources: Development and Applications XIII, 111110F (9 September 2019); doi: 10.1117/12.2532063
Show Author Affiliations
M. Zürch, Univ. of Jena (Germany)
Helmholtz Institute Jena (Germany)
Univ. of California at Berkeley (United States)
F. Tuitje, Univ. of Jena (Germany)
Helmholtz Institute Jena (Germany)
T. Helk, Univ. of Jena (Germany)
Helmholtz Institute Jena (Germany)
J. Gautier, Lab. d'Optique Appliquée (France)
F. Tissandier, Lab. d'Optique Appliquée (France)
J. -P. Goddet, Lab. d'Optique Appliquée (France)
E. Oliva, Univ. Politécnica de Madrid (Spain)
A. Guggenmos, Univ. of California, Berkeley (United States)
Ludwig Maximilian-Univ. Munich (Germany)
U. Kleineberg, Ludwig-Maximilians-Univ. Munich (Germany)
H. Stiel, Max Born Institute Berlin (Germany)
S. Sebban, Lab. d'Optique Appliquée (France)
C. Spielmann, Univ. of Jena (Germany)
Helmholtz Institute Jena (Germany)


Published in SPIE Proceedings Vol. 11111:
X-Ray Lasers and Coherent X-Ray Sources: Development and Applications XIII
Annie Klisnick; Carmen S. Menoni, Editor(s)

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