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Proceedings Paper

Deflectometry (Conference Presentation)
Author(s): Jan Burke

Paper Abstract

This Conference Presentation, "Deflectometry," was recorded at SPIE Optical Metrology 2019 held in Munich, Germany.

Paper Details

Date Published: 16 August 2019
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Proc. SPIE 11056, Optical Measurement Systems for Industrial Inspection XI, 1105612 (16 August 2019);
Show Author Affiliations
Jan Burke, Fraunhofer-Institut für Optronik, Systemtechnik und Bildauswertung IOSB (Germany)


Published in SPIE Proceedings Vol. 11056:
Optical Measurement Systems for Industrial Inspection XI
Peter Lehmann; Wolfgang Osten; Armando Albertazzi Gonçalves Jr., Editor(s)

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