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Proceedings Paper

Effect of tube setting variables on image quality in industrial x-ray computed tomography
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Paper Abstract

To investigate the effects of x ray tube setting on image quality in industrial computed tomography, an experimental characterization with constant tube powers has been reported in this paper. A series of CT scans for a QRM Medium-Contrast-Phantom were performed with a constant tube power of 40W and other scanning parameters, varying tube voltages from 80kV to 125kV and tube currents from 320μA to 500μA. The signal-to-noise ratio (SNR) and contrast-to-noise ratio (CNR) measured on the reconstructed images indicated that increasing the tube voltage can improve the SNR, as well as the CNR in high density areas. While in low density regions in the phantom, higher CNR resulted from lower voltage or higher tube current. Furthermore, a custom-made aluminum cylinder is scanned several times for the assessment of the CT spatial resolution, similarly keeping a constant tube power and variable tube voltages and currents. According to the obtained modulation transfer function (MTF)1/10 values, defined as the spatial frequency corresponding to a contrast loss of 10 %, it is found that using the same tube power, the tube voltage has a greater impact on improving the CT spatial resolution.

Paper Details

Date Published: 10 September 2019
PDF: 5 pages
Proc. SPIE 11113, Developments in X-Ray Tomography XII, 111131U (10 September 2019);
Show Author Affiliations
Xiaoqi Xi, PLA Strategic Support Force Information Engineering Univ. (China)
Zhaoying Sun, PLA Strategic Support Force Information Engineering Univ. (China)
Yu Han, PLA Strategic Support Force Information Engineering Univ. (China)
Lei Li, PLA Strategic Support Force Information Engineering Univ. (China)
Bin Yan, PLA Strategic Support Force Information Engineering Univ. (China)
Yongchao Li, PLA Strategic Support Force Information Engineering Univ. (China)


Published in SPIE Proceedings Vol. 11113:
Developments in X-Ray Tomography XII
Bert Müller; Ge Wang, Editor(s)

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