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Understanding the effect of THz/mm wave-plasma interaction on the brightness of glow discharge detectors
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Paper Abstract

Today, the fact that non-ionizing THz and mm wave can be used in many areas reveals the necessity of devices that can efficiently detect these waves. Compared to existing commercial detectors, cost-effective neon indicator lamps acting as glow discharge detectors (GDDs) are known to be better in speed and responsivity. In GDDs, detection occurs as a result of the interaction between radiation and plasma. Although there are many studies in the literature trying to explain this interaction, these studies are limited to qualitative explanations made as a result of the experiments and the analytical models. Since GDDs are low pressure, non-local thermal equilibrium (non-LTE) plasma lamps, the plasma in these detectors has been simulated by using the parallel 1d3v Particle in Cell/Monte Carlo Collision (PIC/MCC) code, which can be used to study the kinetic behavior of particles. The interaction between plasma and THz/mm wave have also been included to the simulation code in order to examine the effect of this interaction. The results show that not only the electrical but also the optical detection mechanism that has been recently shown using GDDs could be analyzed with this code. Therefore, in this study, the reason for the brighter glow observed as a result of plasma-THz/mm wave interaction is investigated. In this context, the effect of THz/mm wave on one of excited states responsible for the light emitted by GDD is simulated and the results are discussed.

Paper Details

Date Published: 18 October 2019
PDF: 8 pages
Proc. SPIE 11164, Millimetre Wave and Terahertz Sensors and Technology XII, 111640A (18 October 2019); doi: 10.1117/12.2531701
Show Author Affiliations
Cemre Kusoglu-Sarikaya, Middle East Technical Univ. (Turkey)
Demiral Akbar, Ostim Technical Univ. (Turkey)
Hakan Altan, Middle East Technical Univ. (Turkey)


Published in SPIE Proceedings Vol. 11164:
Millimetre Wave and Terahertz Sensors and Technology XII
Neil A. Salmon; Frank Gumbmann, Editor(s)

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