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Development of nanostructured antireflection coatings for infrared sensing applications
Author(s): Ashok K. Sood; John W. Zeller; Adam W. Sood; Gopal G. Pethuraja; Roger E. Welser; Harry Efstathiadis; Anand V. Sampath; Nibir K. Dhar
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Paper Abstract

Infrared (IR) technology plays a critical role in various military and civilian applications including target acquisition, surveillance, night vision, and target tracking. IR sensors and systems operating from the short-wave infrared (SWIR) to long-wave infrared (LWIR) spectra are being developed for defense and commercial system applications. Performance of these IR systems is substantially limited by signal loss due to reflection off the IR substrates and optical components. Optical coatings with high antireflection (AR) characteristics can overcome this limitation and thus enhance the performance of IR systems. We are developing and advancing high-performance antireflection (AR) coatings for a wide range of spectral bands on various substrates for a variety of defense and commercial applications. The AR coatings enhance the transmission of light through optical components and devices by significantly minimizing reflection losses, providing substantial improvements over conventional thin-film AR coating technologies. The optical properties of ARcoated optical components and sensor substrates have been measured and fine-tuned to achieve high levels of performance. In this paper, we review our latest work on robust nanostructure-based AR coatings, including recent efforts in the development of the nanostructured AR coatings on silicon and CdZnTe substrates as well as on ZnSe lenses.

Paper Details

Date Published: 9 September 2019
PDF: 9 pages
Proc. SPIE 11129, Infrared Sensors, Devices, and Applications IX, 111290I (9 September 2019); doi: 10.1117/12.2531642
Show Author Affiliations
Ashok K. Sood, Magnolia Optical Technologies, Inc. (United States)
John W. Zeller, Magnolia Optical Technologies, Inc. (United States)
Adam W. Sood, Magnolia Optical Technologies, Inc. (United States)
Gopal G. Pethuraja, Magnolia Optical Technologies, Inc. (United States)
Roger E. Welser, Magnolia Optical Technologies, Inc. (United States)
Harry Efstathiadis, SUNY Polytechnic Institute (United States)
Anand V. Sampath, U.S. Army Research Lab. (United States)
Nibir K. Dhar, U.S. Army Night Vision & Electronic Sensors Directorate (United States)


Published in SPIE Proceedings Vol. 11129:
Infrared Sensors, Devices, and Applications IX
Paul D. LeVan; Priyalal Wijewarnasuriya; Ashok K. Sood, Editor(s)

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