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Proceedings Paper

3-D measurement based on phase-shifting using calibration of light plane
Author(s): Yingqing Chen; Sining Li; Wei Lu; Zijian Li; Gang Liu
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Paper Abstract

Based on the phase-shifting fringe scanning projection technique using MEMS galvanometer, the threedimensional shape measurement of the object can be realized. However, we found that the experimental results were more sensitive to some experimental parameters. To avoid it, we introduced a light plane calibration model in the threedimensional measurement system. This calibration model avoids the physical measurement of some experimental parameters, and at the same time makes the operation more convenient and faster, and improves the stability and operability of the experiment. Through the detection experiment of the plane, the relative root mean square relative error of the obtained result is 9.155mm, which is greatly improved compared with the previous experimental results, but the result is still not ideal. We discuss some factors affecting the accuracy of the system which can be improved in the future. The experiment proved its feasibility and potential, and the Powell prism and MEMS galvanometer selected are small in size. The dimensions of Powell prism and MEMS galvanometer are 9.0mm 8.0mm and 2.5mm 3.0mm respectively. The miniaturization of equipment is very advantageous for achieving integration and maintenance of the device.

Paper Details

Date Published: 17 May 2019
PDF: 11 pages
Proc. SPIE 11170, 14th National Conference on Laser Technology and Optoelectronics (LTO 2019), 1117008 (17 May 2019); doi: 10.1117/12.2531466
Show Author Affiliations
Yingqing Chen, Harbin Institute of Technology (China)
Sining Li, Harbin Institute of Technology (China)
Wei Lu, Harbin Institute of Technology (China)
Zijian Li, Harbin Institute of Technology (China)
Gang Liu, Harbin Institute of Technology (China)

Published in SPIE Proceedings Vol. 11170:
14th National Conference on Laser Technology and Optoelectronics (LTO 2019)
Jianqiang Zhu; Weibiao Chen; Zhenxi Zhang; Minlin Zhong; Pu Wang; Jianrong Qiu, Editor(s)

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