Share Email Print

Proceedings Paper

Hard x-ray nanoprobe: a scanning hard x-ray microscopy beamline offering multi-modal imaging capabilities at 10 nm
Author(s): Hanfei Yan; Xiaojing Huang; Yong S. Chu; Ajith Pattammattel; Evgeny Nazaretski; Petr Ill
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

Scanning hard x-ray microscopy is a versatile imaging tool that offers a suite of analytic x-ray techniques for studying spatially-resolved elemental, structural and chemical variations. Recent advances in nano-focusing optics and instrumentation have pushed the frontier of the field into multi-modal imaging in 3D and with nanoscale resolution. Here we present current imaging capabilities provided by the hard x-ray nanoprobe of the National Synchrotron Light Source II at Brookhaven National Laboratory. A variety of imaging modalities (absorption, phase, fluorescence and diffraction) will be discussed, as well as the data analysis challenges associated with them. We show that x-ray imaging at about 10 nm resolution has become routine measurements at the beamline, and has been used for a wide spectrum of scientific applications.

Paper Details

Date Published: 27 September 2019
PDF: 6 pages
Proc. SPIE 11112, X-Ray Nanoimaging: Instruments and Methods IV, 1111202 (27 September 2019); doi: 10.1117/12.2531196
Show Author Affiliations
Hanfei Yan, Brookhaven National Lab. (United States)
Xiaojing Huang, Brookhaven National Lab. (United States)
Yong S. Chu, Brookhaven National Lab. (United States)
Ajith Pattammattel, Brookhaven National Lab. (United States)
Evgeny Nazaretski, Brookhaven National Lab. (United States)
Petr Ill, Brookhaven National Lab. (United States)

Published in SPIE Proceedings Vol. 11112:
X-Ray Nanoimaging: Instruments and Methods IV
Barry Lai; Andrea Somogyi, Editor(s)

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?