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Correlative conventional scanning and ptychographic soft x-ray microscopy
Author(s): Jiangtao Zhao; Kasra Nowrouzi; Richard Celestre; Matthew Marcus; Young-Sang Yu; David A. Shapiro
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Paper Abstract

Recent plans for x-ray synchrotrons to upgrade to new high brightness lattices have created great excitement about the potential for coherent x-ray imaging to provide a view of nano-materials with high spatial and temporal resolution. However, with increased x-ray brightness comes the inherent risk of radiation damage and the limited speed of current experimental systems. The Advanced Light Source has an extensive program in coherent scanning transmission x-ray microscopy (STXM) and ptychographic imaging with four beamlines covering an energy range of 200 to 2500 eV. Current instrument development efforts are focused on high-dynamic scanning for increased speed and the use of fast x-ray pixel detectors for high resolution ptychographic imaging. Our new microscope, called Nanosurveyor2, can scan at rates of up to 1 mm per second and has achieved a resolution of 3 times the x-ray wavelength. Using this system, we are developing novel scan trajectories and low dose imaging methods which combine high speed conventional STXM imaging with high resolution ptychography. Principal component analysis is used to extract high statistics spectra from noisy and low-resolution STXM data which are then used to _t a small number of ptychographic images for high spatial resolution chemical mapping with relatively low dose. We consider applications in the energy sciences where x-ray exposure has been observed to reduce the oxidation state of relevant compounds.

Paper Details

Date Published: 9 September 2019
PDF: 7 pages
Proc. SPIE 11112, X-Ray Nanoimaging: Instruments and Methods IV, 111120C (9 September 2019); doi: 10.1117/12.2531177
Show Author Affiliations
Jiangtao Zhao, Lawrence Berkeley National Lab. (United States)
Kasra Nowrouzi, Lawrence Berkeley National Lab. (United States)
Richard Celestre, Lawrence Berkeley National Lab. (United States)
Matthew Marcus, Lawrence Berkeley National Lab. (United States)
Young-Sang Yu, Lawrence Berkeley National Lab. (United States)
David A. Shapiro, Lawrence Berkeley National Lab. (United States)


Published in SPIE Proceedings Vol. 11112:
X-Ray Nanoimaging: Instruments and Methods IV
Barry Lai; Andrea Somogyi, Editor(s)

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