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Proceedings Paper

First commissioning results of the KB mirrors at the SCS instrument of the European XFEL
Author(s): G. Mercurio; C. Broers; R. Carley; J. T. Delitz; N. Gerasimova; L. Le Guyarder; L. Mercadier; A. Reich; J. Schlappa; M. Teichmann; A. Yaroslavtsev; M. Cascella; K. Setoodehnia; M. Schneider; B. Pfau; S. Eisebitt; V. Vozda; V. Hájková; L. Vyšín; T. Burian; J. Chalupský; L. Juha; S. G. Alcock; I. Nistea; D. La Civita; H. Sinn; M. Vannoni; A. Scherz
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Paper Abstract

The Spectroscopy and Coherent Scattering (SCS) instrument of the European XFEL is a soft X-ray beamline aiming to unravel electronic, spin and structural properties of materials in ultrafast processes at the nanoscale. Various experimental techniques offered at SCS have different requirements in terms of beam size at the sample. Kirkpatrick-Baez (KB) refocusing optics equipped with mechanical benders allows for independent change of the horizontal and vertical beam size. We report here on the first characterization of the SCS KB mirrors by means of a novel diffraction-based technique which images the beam profile on a 2D pixelated detector. This approach provides a quick characterization of micrometer beam sizes. Results are compared with metrology measurements obtained with a non-contact slope profiler.

Paper Details

Date Published: 9 September 2019
PDF: 8 pages
Proc. SPIE 11109, Advances in Metrology for X-Ray and EUV Optics VIII, 111090F (9 September 2019);
Show Author Affiliations
G. Mercurio, European XFEL GmbH (Germany)
C. Broers, European XFEL GmbH (Germany)
R. Carley, European XFEL GmbH (Germany)
J. T. Delitz, European XFEL GmbH (Germany)
N. Gerasimova, European XFEL GmbH (Germany)
L. Le Guyarder, European XFEL GmbH (Germany)
L. Mercadier, European XFEL GmbH (Germany)
A. Reich, European XFEL GmbH (Germany)
J. Schlappa, European XFEL GmbH (Germany)
M. Teichmann, European XFEL GmbH (Germany)
A. Yaroslavtsev, European XFEL GmbH (Germany)
M. Cascella, European XFEL GmbH (Germany)
K. Setoodehnia, European XFEL GmbH (Germany)
M. Schneider, Max-Born Institut für Nichtlineare Optik und Kurzzeitspektroskopie (Germany)
B. Pfau, Max-Born Institut für Nichtlineare Optik und Kurzzeitspektroskopie (Germany)
S. Eisebitt, Max-Born Institut für Nichtlineare Optik und Kurzzeitspektroskopie (Germany)
V. Vozda, Institute of Physics of the CAS, v.v.i. (Czech Republic)
V. Hájková, Institute of Physics of the CAS, v.v.i. (Czech Republic)
L. Vyšín, Institute of Physics of the CAS, v.v.i. (Czech Republic)
T. Burian, Institute of Physics of the CAS, v.v.i. (Czech Republic)
J. Chalupský, Institute of Physics of the CAS, v.v.i. (Czech Republic)
L. Juha, Institute of Physics of the CAS, v.v.i. (Czech Republic)
S. G. Alcock, Diamond Light Source Ltd. (United Kingdom)
I. Nistea, Diamond Light Source Ltd. (United Kingdom)
D. La Civita, European XFEL GmbH (Germany)
H. Sinn, European XFEL GmbH (Germany)
M. Vannoni, European XFEL GmbH (Germany)
A. Scherz, European XFEL GmbH (Germany)


Published in SPIE Proceedings Vol. 11109:
Advances in Metrology for X-Ray and EUV Optics VIII
Lahsen Assoufid; Haruhiko Ohashi; Anand Asundi, Editor(s)

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