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Proceedings Paper

Fourier-transform profilometry using a pulse-encoded fringe pattern
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Paper Abstract

A one-shot technique for profile measurements is presented. A sinusoidal fringe pattern embedded with one-dimensional pulses is used to illuminate the inspected object. The pattern projected on the inspected object is observed by a CCD camera at another view angle. The pulse-encoded fringe pattern provides additional information to identify the fringe order. Even though the surface color or reflectivity varies periodically with positions, it distinguishes the fringe order very well.

Paper Details

Date Published: 9 September 2019
PDF: 7 pages
Proc. SPIE 11123, Photonic Fiber and Crystal Devices: Advances in Materials and Innovations in Device Applications XIII, 111230V (9 September 2019);
Show Author Affiliations
Wei-Hung Su, National Sun Yat-sen Univ. (Taiwan)
Zhi-Hsiang Liu, National Sun Yat-sen Univ. (Taiwan)


Published in SPIE Proceedings Vol. 11123:
Photonic Fiber and Crystal Devices: Advances in Materials and Innovations in Device Applications XIII
Shizhuo Yin; Ruyan Guo, Editor(s)

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