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Proceedings Paper

Profile measurements using contrast-encoded pattern projections
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Paper Abstract

A contrast-encoded method based on the phase-shifting technique for 3D shape measurements is presented. Phase extraction is performed by the phase-shifting technique, while unwrapping is discerned by the quaternary contrastencoded patterns. There is no need to take additional projections for phase unwrapping. The fringe patterns used for phase extraction can be analyzed for unwrapping directly. This makes it more efficient to perform high speed, real time, and low cost 3-D shape measurements.

Paper Details

Date Published: 9 September 2019
PDF: 7 pages
Proc. SPIE 11123, Photonic Fiber and Crystal Devices: Advances in Materials and Innovations in Device Applications XIII, 111230U (9 September 2019);
Show Author Affiliations
Nai-Jen Cheng, National Kaohsiung Univ. of Science and Technology (Taiwan)
Sih-Yue Chen, National Sun Yat-sen Univ. (Taiwan)
Wei-Hung Su, National Sun Yat-sen Univ. (Taiwan)


Published in SPIE Proceedings Vol. 11123:
Photonic Fiber and Crystal Devices: Advances in Materials and Innovations in Device Applications XIII
Shizhuo Yin; Ruyan Guo, Editor(s)

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