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VERT-X: VERTical X-ray raster-scan facility for ATHENA calibration. The concept design.
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Paper Abstract

Calibration of the ATHENA telescope is a critical aspect of the project and raises significant difficulties due to the unprecedented size, mass and focal length of the mirror assembly. The VERT-X project, financed by ESA and started in January 2019 by a Consortium led by INAF and which includes EIE, Media Lario Technologies, GPAP, and BCV Progetti, aims to design an innovative calibration facility. In the VERT-X design the parallel beam, needed for calibration, is produced placing a source in the focus of an X-ray collimator. This system is mounted on a raster-scan mechanism which covers the entire ATHENA optics. The compactness of the VERT-X design allows a vertical geometry for the ATHENA calibration facility, with several potential benefits with respect to the long horizontal tube calibration facilities.

Paper Details

Date Published: 10 September 2019
PDF: 13 pages
Proc. SPIE 11119, Optics for EUV, X-Ray, and Gamma-Ray Astronomy IX, 111190O (10 September 2019); doi: 10.1117/12.2530713
Show Author Affiliations
A. Moretti, Istituto Nazionale di Astrofisica (Italy)
G. Pareschi, Istituto Nazionale di Astrofisica (Italy)
M. Uslenghi, Istituto Nazionale di Astrofisica (Italy)
M. Tordi, EIE Group s.r.l. (Italy)
R. Bressan, EIE Group s.r.l. (Italy)
G. Valsecchi, Media Lario S.r.l. (Italy)
F. Zocchi, Media Lario S.r.l. (Italy)
P. Attina, GPAP (Italy)
F. Amisano, GPAP (Italy)
G. Sironi, Istituto Nazionale di Astrofisica (Italy)
B. Salmaso, Istituto Nazionale di Astrofisica (Italy)
S. Basso, Istituto Nazionale di Astrofisica (Italy)
G. Tagliaferri, Istituto Nazionale di Astrofisica (Italy)
D. Spiga, Istituto Nazionale di Astrofisica (Italy)
N. La Palombara, Istituto Nazionale di Astrofisica (Italy)
M. Fiorini, Istituto Nazionale di Astrofisica (Italy)
F. Dury, EIE Group s.r.l. (Italy)
F. Marioni, Media Lario S.r.l. (Italy)
G. Parissenti, GPAP (Italy)
G. Parodi, BCV Progetti S.r.l. (Italy)
E. Wille, European Space Research and Technology Ctr. (Netherlands)
P. Corradi, European Space Research and Technology Ctr. (Netherlands)
M. Bavdaz, European Space Research and Technology Ctr. (Netherlands)
I. Ferreira, European Space Research and Technology Ctr. (Netherlands)


Published in SPIE Proceedings Vol. 11119:
Optics for EUV, X-Ray, and Gamma-Ray Astronomy IX
Stephen L. O'Dell; Giovanni Pareschi, Editor(s)

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