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Reliability of ridge waveguide distributed feedback lasers for communications applications: from device specification and failure analysis to life-time calculation
Author(s): Horacio I. Cantú; Giovanni Giuliano; Andrew McKee
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Paper Abstract

In this work, we describe how, from the early stages of device characterization, it is possible to evaluate the suitability of a given device design for the long life-time demand of a challenging deployment environment (uncooled, non-hermetic operation). Understanding the reasons for non-compliance and device failure, as well as their clear association with the device fabrication procedure steps, greatly helps to systematically improve the device quality yield for volume production.

Paper Details

Date Published: 3 October 2019
PDF: 4 pages
Proc. SPIE 11207, Fourth International Conference on Applications of Optics and Photonics, 112072H (3 October 2019); doi: 10.1117/12.2530545
Show Author Affiliations
Horacio I. Cantú, Compound Semiconductor Technologies Global Ltd. (United Kingdom)
Giovanni Giuliano, Compound Semiconductor Technologies Global Ltd. (United Kingdom)
Andrew McKee, Compound Semiconductor Technologies Global Ltd. (United Kingdom)


Published in SPIE Proceedings Vol. 11207:
Fourth International Conference on Applications of Optics and Photonics
Manuel Filipe P. C. M. Martins Costa, Editor(s)

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