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Optimized illumination for high-throughput ptychography
Author(s): Yudong Yao; Junjing Deng; Jeffrey A. Klug; Yi Jiang; Michael Wojcik; Youssef Nashed; Curt Preissner; Christian Roehrig; Zhonghou Cai; Oliver Cossairt; Stefan Vogt; Barry Lai
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Paper Abstract

As a scanning version of coherent diffraction imaging (CDI), X-ray ptychography has become a popular and very successful method for high-resolution quantitative imaging of extended specimens. The requirements of mostly coherent illumination and the scanning mechanism limit the throughput of ptychographic imaging. In this paper, we will introduce the methods we use at the Advanced Photon Source (APS) to achieve highthroughput ptychography by optimizing the parameters of the illumination beam. One work we have done is increasing the illumination flux by using a double-multilayer monochromator (DMM) optics with about 0.8% bandwidth. Compared with our double-crystal monochromator (DCM) optics with 0.01% bandwidth, this DMM optics provides around 20 times more flux. A multi-wavelength reconstruction method has been implemented to deal with the consequential degraded temporal coherence from such an illumination to ensure high-quality reconstruction. In the other work, we adopt a novel use of at-top focusing optics to generate a at-top beam with the diameter of about 1.5 μm on the focal plane. The better uniformity of the probe and the large beam size allow one to significantly increase the step size in ptychography scans and thereby the imaging efficiency.

Paper Details

Date Published: 9 September 2019
PDF: 8 pages
Proc. SPIE 11112, X-Ray Nanoimaging: Instruments and Methods IV, 111120G (9 September 2019); doi: 10.1117/12.2530527
Show Author Affiliations
Yudong Yao, Argonne National Lab. (United States)
Junjing Deng, Argonne National Lab. (United States)
Jeffrey A. Klug, Argonne National Lab. (United States)
Yi Jiang, Argonne National Lab. (United States)
Michael Wojcik, Argonne National Lab. (United States)
Youssef Nashed, Argonne National Lab. (United States)
Curt Preissner, Argonne National Lab. (United States)
Christian Roehrig, Argonne National Lab. (United States)
Zhonghou Cai, Argonne National Lab. (United States)
Oliver Cossairt, Northwestern Univ. (United States)
Stefan Vogt, Argonne National Lab. (United States)
Barry Lai, Argonne National Lab. (United States)


Published in SPIE Proceedings Vol. 11112:
X-Ray Nanoimaging: Instruments and Methods IV
Barry Lai; Andrea Somogyi, Editor(s)

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